Recursive Learning: An Attractive Alternative to the Decision Tree for Test Genration in Digital Circuits

Editorial Board Pattern Sensitivity in MOS Memories p. 2 Diagnostic Testing of MOS Random Access Memories p. 6 Testing Semiconductor Memories p. 11 What Is Necessary for Testing "ROMs" and "PROMs"? p. 26 Microprocessor Function Test Generation on the Sentry 600 p. 32 A Tutorial Paper on Software Approaches to Testing of Microprocessor Systems p. 41 Can a User Test LSI Microprocessors Effectively? p. 47 Fault Coverage of Test Programs for a Microprocessor p. 50 ECL Device Testing p. 55 Faults Which Challenge the In-Circuit Tester: Some Examples and Some Solutions p. 59 Real-World Board Test Effectiveness: What Does It Mean When the Board Passes? p. 66 A New Approach to High-Speed CODEC Testing p. 72 Automated Measurement of 12 to 16-Bit Converters p. 78 Electron Beam Testing of Microprocessors p. 87 Automated Fault Diagnostic EB Tester and Its Application to a 4OK-Gate VLSI Circuit p. 93